An SPI NOR Flash memory from GigaDevice in China has been certified to ISO2626 ASIL D, the highest level of safety for automotive designs.
The GD25/55 adds single point fault metric (SPFM) and an estimated probabilistic metric for random hardware failures (PMHF) to achieve ASIL D level from the TuV Sud certification body in Germany. The design also includes built-in ECC and CRC check functions for enhanced data integrity, supporting up to 100,000 erase/write cycles and a data retention period of 20 years.
- Flash memory failure leads to Tesla recall
- Tesla recalls 2m vehicle sin the US
The SPI NOR Flash series provides storage capacities ranging from 2Mb to 2Gb and providing data throughput rates of up to 400MB/s. The memory devices implement several communication modes, including single-channel, dual-channel, quad-channel, and octal-channel serial peripheral (SPI) interfaces automotive environments. This is key for reliability in Advanced Driver Assistance Systems (ADAS), Autonomous Driving, Battery Management Systems (BMS), and In-Vehicle Infotainment, where NOR flash failures have caused vehicles recalls.
The memory devices are qualified to AEC-Q100 Grade 1 standards and are manufactured using 55nm/45nm process technology.
The ASIL D SPI NOR flash memories are available through distributor Macnica ATD Europe with technical assistance.
Leave a comment